Module 9 � XPS - 2014

Most likely schedule: Weeks 43-45

This module is meant to introduce the students to the instrumentation and theory of XPS, the most widely used method in surface analysis. It will contain theory and application within a framework that includes a problem solving approach to complex real world systems. The course is divided into: formal lecture material, teamwork based problem set assignments, laboratory work and off line data processing

Material to be covered: 

� Instrumentation.

� Basic theory for X-ray Photoelectron Spectroscopy

� Applications: thin films, catalysis, corrosion, adhesion, semiconductors polymers, photovoltaics, fuel cells are some indicative material fields.

Teachers:

Spyros Diplas� Spyros.Diplas@sintef.no and Sissel J�rgensen� sisselj@kjemi.uio.no

Evaluation: Passed/failed based upon written laboratory reports.

Laboratory work: This will be done in collaboration with SINTEF.

Useful References:

� 1. Surface Analysis by Auger and X-ray Photoelectron Spectroscopy. Edited by D. Briggs and J.T. Grant

� 2. An Introduction to Surface Analysis by XPS and AES by JohnF. Watts & John Wolstenholme (if you can get hold of it)

� 3. Practical Surface Analysis, vol. 1 - Auger and X-ray Photoelectron Spectroscopy. Edited by D. Briggs and M.P. Seah

�4. http://www.chem.qmul.ac.uk/surfaces/scc/ 

� 5. http://www.casaxps.com/ebooks/XPS%20AES%20Book%20new%20margins%20rev%201.2%20for%20web.pdf